
HM 204 ion air gun
Principle and application scope of ion air gun:
HM-204 ion air gun is a hand-held device for removing static electricity and dust on the surface of objects. It can be used only with compressed air and high-pressure generator.
The HM-204 ion air gun can generate a large amount of airflow with positive and negative charges, which is blown out by the compressed gas at high speed, which can neutralize the charge carried on the object. When the surface of the object is negatively charged, it will attract positive charges in the airflow. When the surface of the object is positively charged, it will attract negative charges in the airflow, thereby neutralizing the static electricity on the surface of the object to achieve elimination The purpose of static electricity.
HM-204 ion air gun is widely used in plastic spraying, electronics, LED photoelectricity, printing, pharmaceutical and other industries.
Features:
1. The neutralization of static electricity is rapid, and the electrostatic dust removal effect is better;
2. The ionic airflow covers a large area, small size, and handheld operation;
3. The air gun has a good grounding protection function;
4. It needs to be used with HM-007 or HM-007S/4.6KV high voltage generator.
Technical parameters (Specification)
Model (Model) | HM-204 |
Input voltage | 220VAC (or or) 110VAC |
Operating Voltage | 4.6KV |
Power Consumption | 30VA |
Operating temperature | 0℃~50℃ |
HV cable length | 3M |
Weight | 0.5Kg |
Working air pressure | 0.3~0.7Mpa |
Operating air velocity (Operting air velocity) | 10m/1sec |
Air Consumption | About 5m3/H(0.5MPA) |
Test results (Decay Test Results)
Testing Conditions | Test voltage (T esting Voltage) +1000V~100V, -1000V~100V | |
Ambient temperature (Temp erature) 5℃~25℃ Relative humidity (RH) ≤60% | ||
Test distance (Distance) 200mm | ||
Decay Time | Positive≤1.0s | Negative≤1.0s |
Offset Voltage | ≤±35V | ≤±35V |
Remarks:
1. The test data is based on the ME-268A electrostatic tester results.
2. The speed measurement data will change due to the ambient temperature and humidity during the test.